JPH0328150B2 - - Google Patents
Info
- Publication number
- JPH0328150B2 JPH0328150B2 JP56134251A JP13425181A JPH0328150B2 JP H0328150 B2 JPH0328150 B2 JP H0328150B2 JP 56134251 A JP56134251 A JP 56134251A JP 13425181 A JP13425181 A JP 13425181A JP H0328150 B2 JPH0328150 B2 JP H0328150B2
- Authority
- JP
- Japan
- Prior art keywords
- thyristor
- circuit
- voltage
- monitoring
- output
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
Classifications
-
- H—ELECTRICITY
- H02—GENERATION; CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
- H02M—APPARATUS FOR CONVERSION BETWEEN AC AND AC, BETWEEN AC AND DC, OR BETWEEN DC AND DC, AND FOR USE WITH MAINS OR SIMILAR POWER SUPPLY SYSTEMS; CONVERSION OF DC OR AC INPUT POWER INTO SURGE OUTPUT POWER; CONTROL OR REGULATION THEREOF
- H02M1/00—Details of apparatus for conversion
- H02M1/08—Circuits specially adapted for the generation of control voltages for semiconductor devices incorporated in static converters
- H02M1/081—Circuits specially adapted for the generation of control voltages for semiconductor devices incorporated in static converters wherein the phase of the control voltage is adjustable with reference to the AC source
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/26—Testing of individual semiconductor devices
- G01R31/2607—Circuits therefor
- G01R31/263—Circuits therefor for testing thyristors
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- Power Engineering (AREA)
- Power Conversion In General (AREA)
- Protection Of Static Devices (AREA)
- Electronic Switches (AREA)
- Electrophonic Musical Instruments (AREA)
Priority Applications (4)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP56134251A JPS5836169A (ja) | 1981-08-28 | 1981-08-28 | サイリスタ監視装置 |
AT82107766T ATE24774T1 (de) | 1981-08-28 | 1982-08-24 | Ueberwachungsschaltung fuer einen thyristor. |
EP82107766A EP0073059B1 (de) | 1981-08-28 | 1982-08-24 | Überwachungsschaltung für einen Thyristor |
DE8282107766T DE3275014D1 (en) | 1981-08-28 | 1982-08-24 | Control circuit for a thyristor |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP56134251A JPS5836169A (ja) | 1981-08-28 | 1981-08-28 | サイリスタ監視装置 |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS5836169A JPS5836169A (ja) | 1983-03-03 |
JPH0328150B2 true JPH0328150B2 (en]) | 1991-04-18 |
Family
ID=15123923
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP56134251A Granted JPS5836169A (ja) | 1981-08-28 | 1981-08-28 | サイリスタ監視装置 |
Country Status (4)
Country | Link |
---|---|
EP (1) | EP0073059B1 (en]) |
JP (1) | JPS5836169A (en]) |
AT (1) | ATE24774T1 (en]) |
DE (1) | DE3275014D1 (en]) |
Families Citing this family (12)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5932319A (ja) * | 1982-08-13 | 1984-02-21 | 富士電機株式会社 | サイリスタスイツチ故障監視方式 |
DE3409908A1 (de) * | 1984-03-17 | 1985-09-26 | Korea Ginseng & Tobacco Research Institute, Daejun | Verfahren und vorrichtung zum expandieren von tabakblaettern |
US5521593A (en) * | 1991-12-03 | 1996-05-28 | General Electric Company | Method and apparatus for monitoring operating characteristics of semiconductor electric power switching circuits |
SE515547C2 (sv) * | 1995-03-30 | 2001-08-27 | Abb Ab | Förfarande och system för funktionskontroll av ventilenheter |
EP2097920B1 (de) | 2007-07-23 | 2017-08-09 | TRUMPF Hüttinger GmbH + Co. KG | Plasmaversorgungseinrichtung |
JP4742157B2 (ja) * | 2008-05-29 | 2011-08-10 | 壽士 岡 | システム手帳 |
CN102565662B (zh) * | 2012-03-15 | 2014-08-27 | 株洲变流技术国家工程研究中心有限公司 | 一种高电位晶闸管状态检测装置 |
DE102014105719B4 (de) | 2014-04-23 | 2015-11-26 | Ge Energy Power Conversion Gmbh | Schaltungsvorrichtung mit einer Thyristorschaltung sowie ein Verfahren zum Prüfen der Thyristorschaltung |
CN104764989B (zh) * | 2015-04-02 | 2018-05-01 | 武汉钢铁有限公司 | 一种可控硅脉冲监测装置 |
CN105703481B (zh) * | 2016-03-03 | 2018-03-30 | 南京南瑞继保电气有限公司 | 一种换流阀均压状态一致性统计方法 |
CN106154134B (zh) * | 2016-06-18 | 2017-07-18 | 温州大学 | 一种晶闸管四象限触发特性参数测试装置 |
CN108646161B (zh) * | 2018-05-14 | 2024-01-02 | 中国长江电力股份有限公司 | 一种励磁装置可控硅导通监测装置及方法 |
Family Cites Families (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US3806773A (en) * | 1971-07-17 | 1974-04-23 | Sony Corp | Field effect transistor having back-to-back diodes connected to the gate electrode and having a protective layer between the source and the diodes to prevent thyristor action |
US3787717A (en) * | 1971-12-09 | 1974-01-22 | Ibm | Over voltage protection circuit lateral bipolar transistor with gated collector junction |
-
1981
- 1981-08-28 JP JP56134251A patent/JPS5836169A/ja active Granted
-
1982
- 1982-08-24 EP EP82107766A patent/EP0073059B1/de not_active Expired
- 1982-08-24 AT AT82107766T patent/ATE24774T1/de active
- 1982-08-24 DE DE8282107766T patent/DE3275014D1/de not_active Expired
Also Published As
Publication number | Publication date |
---|---|
EP0073059B1 (de) | 1987-01-07 |
EP0073059A1 (de) | 1983-03-02 |
DE3275014D1 (en) | 1987-02-12 |
JPS5836169A (ja) | 1983-03-03 |
ATE24774T1 (de) | 1987-01-15 |
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